DI-UMONS : Dépôt institutionnel de l’université de Mons

Recherche transversale
Rechercher
(titres de publication, de périodique et noms de colloque inclus)
2002-01-01 - Colloque/Présentation - communication orale - Anglais - 1 page(s)

Gaki A., Gonon Maurice , Descamps J.-C., Cambier Francis, "Quantitative analysis of crystalline phases in refractory materials from Rietveld X-ray analysis" in CIEC 8, Lyon, France, 2002

  • Codes CREF : Cristallographie (DI1262), Matériaux céramiques et poudres (DI2744)
  • Unités de recherche UMONS : Science des Matériaux (F502)
  • Instituts UMONS : Institut de Recherche en Science et Ingénierie des Matériaux (Matériaux)
Texte intégral :

Abstract(s) :

(Anglais) The aim of this work is to show the possibility of using the Rietveld method for the quantitative phase analysis in refractory materials from X-ray diffraction patterns. On this cause, binary and ternary mixtures of known compositions were prepared from selected Al2O3, ZrO2, Y2O3, CaO and Na2O pure powders. Calculations of the amount of each phase was then performed from the X-ray diffraction pattern by using the Rietveld refinement method. In some cases, the results obtained were very close to the exact composition but on the other hand there were other cases where the results deviated strongly from the actual values. It is known that the difference in linear absorption coefficients µ between phase yields to microabsorption effects, which result in erroneous quantitative results and which are not taken into consideration by the basic Rietveld equations. In this case a method for calculating correction factors linked the absorption coefficients of the phases was introduced and led to accurate values.