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Recherche transversale
(titres de publication, de périodique et noms de colloque inclus)
2004-01-01 - Colloque/Présentation - communication orale - Anglais - 1 page(s)

Descamps J.-C., Gaki A., Gonon Maurice , "Quantitative Phases Analysis by Rietveld method-Application to ceramics" in Annual Meeting of the Belgian Ceramic Society, Gand, Belgique, 2002

  • Codes CREF : Cristallographie (DI1262), Matériaux céramiques et poudres (DI2744), Contrôle des matériaux (DI2830)
  • Unités de recherche UMONS : Science des Matériaux (F502)
  • Instituts UMONS : Institut de Recherche en Science et Ingénierie des Matériaux (Matériaux)
Texte intégral :

Abstract(s) :

(Anglais) The aim of this work is to show the possibility of using the Rietveld method for the quantitative phase analysis in refractory materials from X-ray diffraction patterns. On this cause, mixtures of known compositions were prepared and analysed by X-ray diffraction and Rietveld refinement so to obtain quantitative values for each phase. It was found that, in some cases, the results obtained were very close tot the exact composition but that on the other hand there were other cases where the results deviated strongly from the actual values. The difference in linear absorption coefficients µ between phase yields to microabsorption effects, which result in erroneous quantitative results. A method for calculating correction factors linked the absorption coefficients of the phases is proposed and leads to accurate quantitative analysis Moreover a method was introduced to estimate the amount of other phases in a mixture, which are not taken under consideration in Rietveld refinement. An equation was obtained which can be applied to calculate the weight fraction of phases such as amorphous, non-crystalline or more generally unidentified phases, not only in binary but also in multiphase mixtures.