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2010-08-24 - Article/Dans un journal avec peer-review - Anglais - 5 page(s)

Felten Alexandre, Gillon Xavier, Gulas Michal, Pireaux Jean-Jacques, Ke Xiaoxing, Van Tendeloo Gustaaf, Bittencourt Carla , Kilcoyne A.L. David, Najafi Ebrahim, Hitchcock Adam P., "Evaluation of defect density in individual carbon nanotubes using polarization dependent X-ray microscopy" in ACS Nano, 4, 8, 4431–4436

  • Edition : American Chemical Society (DC)
  • Codes CREF : Chimie des solides (DI1316), Physique des plasmas (DI1233)
  • Unités de recherche UMONS : Chimie des interactions plasma-surface (S882)
  • Instituts UMONS : Institut de Recherche en Science et Ingénierie des Matériaux (Matériaux)
Texte intégral :

Abstract(s) :

(Anglais) The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction of structural defects using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting and quantifying point defect density in individual carbon nanotubes (CNTs) based on measuring the polarization dependence (linear dichroism) of the C 1s ? p* transition at specific locations along individual CNTs with a scanning transmission X-ray microscope (STXM). We show that STXM can be used to probe defect density in individual CNTs with high spatial resolution. The quantitative relationship between ion dose, nanotube diameter, and defect density was explored by purposely irradiating selected sections of nanotubes with kiloelectronvolt (keV) Ga+ ions. Our results establish polarization-dependent X-ray microscopy as a new and very powerful characterization technique for carbon nanotubes and other anisotropic nanostructures.

Notes :
  • (Anglais) Publié en ligne le 7 juillet 2010
Identifiants :
  • DOI : 10.1021/nn1002248