DI-UMONS : Dépôt institutionnel de l’université de Mons

Recherche transversale
Rechercher
(titres de publication, de périodique et noms de colloque inclus)
2005-01-01 - Colloque/Présentation - communication orale - Anglais - 1 page(s)

Cambier Francis, Gonon Maurice , "Correction of microabsorption effects in X-ray diffraction quantitative phase analysis using the Rietveld method" in Annual Meeting of the Belgian Ceramic Society, Gand, Belgique, 2002

  • Codes CREF : Sciences de l'ingénieur (DI2000), Matériaux céramiques et poudres (DI2744)
  • Unités de recherche UMONS : Science des Matériaux (F502)
  • Instituts UMONS : Institut de Recherche en Science et Ingénierie des Matériaux (Matériaux)

Abstract(s) :

(Anglais) The Rietveld method is a structural refinement technique using powder diffraction data, introduced by H.M Rietveld in 1969. The main applications of Rietveld method beside structural refinement are quantitative phase analysis and microstructurale investigation. Using the Rietveld method with X-ray powder diffraction for quantitative analysis is a very interesting approach in comparison to conventional methods as takes into consideration the whole pattern instead of a few selected peaks. This method can be applied in many industries as refractories, cements, when materials contain high numbers of phases what leads to peaks highly overlapped. The initial aim of this work was to estimate the accuracy of the quantitative phase analysis in multiphase ceramic materials by Rietveld method using X-ray powder diffraction. Investigation of mixtures (Al2O3, ZrO2, TiO2, CaO…) of known composition shown that the quantitative analysis obtained may strongly differ with the real composition. The error increasing with the differences in absorption coefficients between the phases indicates the need in a correction for microabsorption effects, witch are not taken into consideration in the basic equation.