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2008-05-01 - Article/Dans un journal avec peer-review - Anglais - 5 page(s)

Dahmouchène N., Voué Michel , Stehlé J.L., Defranoux C., Nouvellon C., De Coninck Joël , "Optical properties of NiCrOx thin films" in Physica Status Solidi C. Current Topics in Solid State Physics, 5, 1145-1149

  • Edition : Wiley-VCH Verlag, Weinheim (Germany)
  • Codes CREF : Chimie des surfaces et des interfaces (DI1327), Matériaux optiques (DI1256), Physique des surfaces (DI1265), Optique (DI1250)
  • Unités de recherche UMONS : Laboratoire de Physique des Surfaces et Interfaces (S877), Physique des matériaux et optique (S878)
Texte intégral :

Abstract(s) :

(Anglais) The optical properties of thins NCrOx layer were investigated by spectroscopic ellipsometry (SE). The layers were coated on float glass by magnetron sputtering at different oxygen partial pressures (20% to 30% oxygen in the sputtering gas) and the influence of the degree of oxidation was considered in details. The optical constants of the films n and k, in the visible to near infrared spectral range (0.35 to 1.7 µm), appear to be extremely sensitive to their chemical composition. Complementary studies were carried out using Fourier transform infrared ellipsometry (FTIR-SE) to determine the optical conductivity of the films and compare it with four-points-probe measurements

Notes :
  • (Anglais) Bibliographic Code:2008PSSCR...5.1145D
Identifiants :
  • DOI : 10.1002/pssc.200777780
  • ISSN : 1862-6351