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2005-06-10 - Article/Dans un journal avec peer-review - Anglais - 3 page(s)

Van Overschelde Olivier , Wautelet Michel , "Self-diffraction in a CCD camera" in European Journal of Physics, 26, 15-17

  • Edition : Institute of Physics
  • Codes CREF : Résistance des matériaux (DI2112), Physique de l'état solide (DI1261), Chimie des solides (DI1316), Physique des plasmas (DI1233)
  • Unités de recherche UMONS : Physique expérimentale et biologique (M104), Chimie des interactions plasma-surface (S882)
  • Instituts UMONS : Institut de Recherche en Science et Ingénierie des Matériaux (Matériaux)

Abstract(s) :

(Anglais) CCD (charged coupling device) detectors are made of a large number of pixels, forming a two-dimensional lattice. The dimensions of pixels are in the µm range. So, when irradiated by visible light, the lattice gives rise to diffraction. This self-diffraction may be studied experimentally. The CCD camera is illuminated by a HeNe laser beam. Diffraction patterns are either observed by looking at the light reflected by the camera or measured when looking at the signal given by the camera itself. This may serve as an introduction to usual diffraction by a lattice or as an analogy with two-dimensional electron diffraction (LEED).

Identifiants :
  • DOI : 10.1088/0143-0807/26/5/L01
  • ISSN : 0143-0807